A Multi-Layered 3D NDT Scan-Matching Method for Robust Localization in Logistics Warehouse Environments

Author:

Kim Taeho1,Jeon Haneul1ORCID,Lee Donghun1ORCID

Affiliation:

1. Mechanical Engineering Department, Soongsil University, Seoul 06978, Republic of Korea

Abstract

This paper proposed a multi-layered 3D NDT (normal distribution transform) scan-matching approach for robust localization even in the highly dynamic environment of warehouse logistics. Our approach partitioned a given 3D point-cloud map and the scan measurements into several layers regarding the degree of environmental changes in the height direction and computed the covariance estimates for each layer using 3D NDT scan-matching. Because the covariance determinant is the estimate’s uncertainty, we can determine which layers are better to use in the localization in the warehouse. If the layer gets close to the warehouse’s floor, the degree of environmental changes, such as the cluttered warehouse layout and position of boxes, would be significantly large, while it has many good features for scan-matching. If the observation at a specific layer is not explained well enough, then the layer for localization can be switched to other layers with lower uncertainties. Thus, the main novelty of this approach is that localization robustness can be improved even in very cluttered and dynamic environments. This study also provides the simulation-based validation using Nvidia’s Omniverse Isaac sim and detailed mathematical descriptions for the proposed method. Moreover, the evaluated results of this study can be a good starting point for further mitigating the effects of occlusion in warehouse navigation of mobile robots.

Funder

National Research Foundation of Korea

Institute of Information & communications Technology Planning & Evaluation

MSIT (Ministry of Science and ICT), Korea

Korea Institute for Advancement of Technology

Publisher

MDPI AG

Subject

Electrical and Electronic Engineering,Biochemistry,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry

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