Abstract
The performance of the electron transport layer (ETL) plays a critical role in extending the operational lifespan of organic photovoltaic devices. ZnO is an excellent electron transport layer used in the printable organic photovoltaic cells. A comparison of Ca and ZnO as the ETL in encapsulated bulk heterojunction OPV devices has been undertaken with the device stability dependence on light soaking, temperature, irradiance, and thermal cycling recorded. It was observed that the OPV devices using Ca ETL decayed faster than the ZnO ETL devices under the same light illumination. The degradation in a Ca ETL device is ascribed to the formation of an insulating calcium oxide layer at the ETL interfaces. Photoluminescence (PL) spectroscopy revealed a higher PL signal for the degraded Ca ETL devices compared to the ZnO ETL devices. Power conversion efficiency (PCE) of the ZnO ETL devices was found to be much more stable than the Ca devices. The PCE for ZnO ETL devices still retained 40% of their initial value while the Ca ETL devices failed completely over the period of 18 days in the study, leading to a clear outcome of the study.
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces
Reference46 articles.
1. Photovoltaics Fundamentals, Technology and Application;Messenger,2007
2. Photovoltaics devices;Richards,2007
3. A review of solar photovoltaic technologies
4. Market Report Series: Renewables 2017: Analysis and Forecasts to 2022;Agency,2017
5. Evolution of defects during the degradation of metal halide perovskite solar cells under reverse bias and illumination
Cited by
9 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献