Spectrum Analysis Enabled Periodic Feature Reconstruction Based Automatic Defect Detection System for Electroluminescence Images of Photovoltaic Modules

Abstract

Electroluminescence (EL) imaging is a widely adopted method in quality assurance of the photovoltaic (PV) manufacturing industry. With the growing demand for high-quality PV products, automatic inspection methods based on machine vision have become an emerging area concern to replace manual inspectors. Therefore, this paper presents an automatic defect-inspection method for multi-cell monocrystalline PV modules with EL images. A processing routine is designed to extract the defect features of the PV module, eliminating the influence of the intrinsic structural features. Spectrum domain analysis is applied to effectively reconstruct an improved PV layout from a defective one by spectrum filtering in a certain direction. The reconstructed image is used to segment the PV module into cells and slices. Based on the segmentation, defect detection is carried out on individual cells or slices to detect cracks, breaks, and speckles. Robust performance has been achieved from experiments on many samples with varying illumination conditions and defect shapes/sizes, which shows the proposed method can efficiently distinguish intrinsic structural features from the defect features, enabling precise and speedy defect detections on multi-cell PV modules.