Research on Mobile Phone Backplane Defect Segmentation Based on MDAF-UNet

Author:

Chen Hao12,Min Byung-Won2

Affiliation:

1. School of Computer and Information Engineering, Nantong Institute of Technology, Nantong 226002, China

2. Division of Information and Communication Convergence Engineering, Mokwon University, Daejeon 35349, Republic of Korea

Abstract

Mobile phone backplanes are an important part of mobile phones, and are often affected by a wide range of factors during the manufacturing process, resulting in defects of various scales and similar backgrounds. Therefore, accurately identifying these defects is crucial for improving mobile phone quality. To address this challenge, this paper proposes a multi-scale and dynamic attention fusion UNet (MDAF-UNet) model. The model innovatively combines normal convolution with dilated convolution. This allows the model to capture subtle features of defects and to perceive a larger range of feature variations. Moreover, an improved attention mechanism is introduced in this paper. It fuses channel attention and spatial attention, and dynamically adjusts the feature fusion strategy with learnable weights. This allows the model to increase the attention of important features and improve the effectiveness of feature representation. Experimental results on a publicly available dataset show that the MDAF-UNet model achieves 66.9% Mean Intersection over Union (MIoU), outperforming other state-of-the-art models. This result provides an effective solution to the mobile phone backplane defect segmentation problem.

Publisher

MDPI AG

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