SIMS-EDX system for the quantitative analysis of solids-Reference-Cited by-同舟云学术

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SIMS-EDX system for the quantitative analysis of solids

Published:2012-06-15 Issue:1 Volume:45 Page:506-509
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Kudriavtsev Yu.¹,Asomoza R.¹

Affiliation:

1. Sección Electrónica del Estado Solido, Departamento Ingeniería Eléctrica; CINVESTAV-IPN; Av. IPN #2508; México; DF 07360; México

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference4 articles.

1. Qualitative X-Ray Analysis

2. Patent pending, MX/a/2011/009486

3. Quantitative determination of dopant dose in shallow implants using the low energy x-ray emission spectroscopy technique

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A correlative method to quantitatively image trace concentrations of elements by combined SIMS-EDX analysis;Journal of Analytical Atomic Spectrometry;2021

2. Correlative microscopy combining transmission electron microscopy and secondary ion mass spectrometry: A general review on the state-of-the-art, recent developments, and prospects;Applied Physics Reviews;2019-06

3. Chemical analysis of obsidian by a SIMS/EDX combined system;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2015-01

4. Atomic spectrometry update. Review of advances in the analysis of metals, chemicals and functional materials;J. Anal. At. Spectrom.;2014-09-26

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