Correlative microscopy combining transmission electron microscopy and secondary ion mass spectrometry: A general review on the state-of-the-art, recent developments, and prospects
Author:
Affiliation:
1. Advanced Instrumentation for Ion Nano-Analytics (AINA), Materials Research and Technology Department, Luxembourg Institute of Science and Technology, L-4422 Belvaux, Luxembourg
Funder
Fonds National de la Recherche Luxembourg
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.5064768
Reference98 articles.
1. Transmission Electron Microscopy
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3. Imaging and speciation of trace elements in biological environment
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