A comparison of three‐dimensional electromagnetic and RC parasitic extraction analysis of mm‐wave on‐chip passives in SiGe BiCMOS low‐noise amplifiers-Reference-Cited by-同舟云学术

A comparison of three‐dimensional electromagnetic and RC parasitic extraction analysis of mm‐wave on‐chip passives in SiGe BiCMOS low‐noise amplifiers

Published:2019-12-13 Issue:2 Volume:30 Page:
ISSN:1096-4290
Container-title:International Journal of RF and Microwave Computer-Aided Engineering
language:en
Short-container-title:Int J RF Microw Comput Aided Eng

Author:

Sagouo Minko Flavien¹^ORCID,Stander Tinus¹

Affiliation:

1. Department of EEC Engineering, Carl and Emily Fuchs Institute for MicroelectronicsUniversity of Pretoria Pretoria South Africa

Funder

National Research Foundation

Publisher

Wiley

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Computer Science Applications

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/mmce.22019

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1. Effect of TID electronradiation on SiGe BiCMOS LNAs at V-band;Microelectronics Reliability;2020-09

2. EM Modelling Considerations for mm-Wave On-Chip Antennas;IOP Conference Series: Materials Science and Engineering;2020-02-01