Electron-Impact (EI) Secondary Neutral Mass Spectrometry (SNMS)
Author:
Publisher
Wiley-VCH Verlag GmbH & Co. KGaA
Link
http://onlinelibrary.wiley.com/wol1/doi/10.1002/9783527636921.ch9/fullpdf
Reference66 articles.
1. Sputtering of Surfaces by Positive Ion Beams of Low Energy
2. Mass Analysis of Sputtered Particles
3. Secondary ion yields near 1 for some chemical compounds
4. A method for surface analysis by sputtered neutrals
5. Combined depth profile analysis with SNMS, SIMS and XPS: Preferential sputtering and oxygen transport in binary metal oxide multilayer systems
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