Oscillations and huge preferences of PbTe crystal surface sputtering under Secondary Neutral Mass Spectrometry conditions
Author:
Publisher
Elsevier BV
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Reference8 articles.
1. Sigmund P: Elements of Sputtering Theory. In: Nanofabrication by Ion-Beam Sputtering. T. Som, D. Kanjilal. Pan Stanford Publishing, 2013, p. 1–40
2. Kopnarski M, Jennet H. Electron Impact (EI) Secondary Neutral Mass Spectrometry (SNMS). In: Friedbacher, Bubert H., editors. Surface and Thin Film Analysis. A Compendium of Principles, Instrumentation, and Applications, Wiley-VCH Verlag GmbH &Co. KGaA, 2011, p. 161-178.
3. Secondary neutral Mass spectrometry (SNMS) and its application to depth profile and interface analysis;Oechsner,1984
4. Segregation of the Eu impurity as function of its concentration in the melt for growing of the lead telluride doped crystals by the Bridgman method
5. Feldman LC, Mayer JW: Fundamentals of Surface and Thin Film Analysis, North-Holland, 1986
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1. Transformations of micron-sized PbTe surface structures induced by low energy ions;Journal of Alloys and Compounds;2021-11
2. Sputtering rate of lead, tin and germanium tellurides with low energy argon ions;Computational Problems of Electrical Engineering;2021-04-25
3. Analyzing of lead, tin and germanium tellurides by means of secondary neutral mass spectrometry: Features, problems and possibilities;Materials Today: Proceedings;2021
4. Relative detection factor for quantification of Secondary Neutral Mass Spectrometry measurements of PbTe binary telluride;Vacuum;2019-05
5. Amorphisation effect in binary tellurides under low energy Ar+ ion bombardment;Materials Letters;2019-02
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