Determination of the electron backscattering coefficient for thin films using double layers
Author:
Publisher
Wiley
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference10 articles.
1. and , to be published.
2. Scanning Electron Microscopy 1978, Vol. I, SEM Inc., AMF O'Hare (p. 741).
3. Quoted By and , in: Rasterelektronenmikroskopie, 2nd ed., Springer-Verlag, Berlin/Heidelberg/New York 1977 (p. 36).
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