Backscattered Electron Contrast Imaging of Scanning Electron Microscopy for Identifying Double Layered Nano-Scale Elements-Reference-Cited by-同舟云学术

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Backscattered Electron Contrast Imaging of Scanning Electron Microscopy for Identifying Double Layered Nano-Scale Elements

Published:2011 Issue:3 Volume:17 Page:341-345
ISSN:1341-1756
Container-title:Journal of Surface Analysis
language:en
Short-container-title:JSA

Author:

Kim Hyonchol¹,Negishi Tsutomu²,Kudo Masato²,Takei Hiroyuki¹³,Yasuda Kenji¹⁴

Affiliation:

1. Kanagawa Academy of Science and Technology

2. JEOL Ltd

3. Department of Life Sciences, Faculty of Life Sciences, Toyo University

4. Department of Biomedical Information, Division of Biosystems, Institute of Biomaterials and Bioengineering, Tokyo Medical and Dental University

Publisher

Surface Analysis Society of Japan

Link

https://www.jstage.jst.go.jp/article/jsa/17/3/17_341/_pdf

Reference13 articles.

1. [1] T. Sakurada, S. Hashimoto, Y. Tsuchiya, S. Tachibana, M. Suzuki and K. Shimizu, J. Surf. Anal. 12, 118 (2005).

2. [2] G. Neubert and S. Rogaschewski, Physica Status Solidi A Appl. Res. 59, 35 (1980).

3. [3] H. Niedrig, J. Appl. Phys. 53, R15 (1982).

4. [4] G. Neubert and S. Rogaschewski, Physica Status Solidi A Appl. Res. 75, K191 (1983).

5. [5] A. Jablonski, H.S. Hansen, C. Jansson and S. Tougaard, Phys. Rev. B 45, 3694 (1992).

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