AES depth profile studies of interdiffusion in the AgCu bilayer and multilayer thin films
Author:
Publisher
Wiley
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference14 articles.
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5. in: Practical Surface Analysis by Auger and X-Ray Spectroscopies, Ed. and , Chap. 4, Wiley, Chichester 1983 (p. 141).
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