Author:
Beister G.,Duckert K.,Hottewitzsch P.,Klose H.
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Cited by
2 articles.
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1. Measurement methods, part D;Impurities and Defects in Group IV Elements, IV-IV and III-V Compounds. Part a: Group IV Elements
2. Measurement methods, part A;Impurities and Defects in Group IV Elements, IV-IV and III-V Compounds. Part a: Group IV Elements