Author:
Beister G.,Duckert K.,Hottewitzsch P.,Klose H.
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Cited by
5 articles.
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1. Modeling;Semiconducting Devices;1976
2. Impulse measurement of doping profiles in MOS structures using the second harmonic method;Physica Status Solidi (a);1975-03-16
3. Capacitance of p+ −n junctions with deep centres II. Experiments;Physica Status Solidi (a);1973-11-16
4. Measurement methods, part D;Impurities and Defects in Group IV Elements, IV-IV and III-V Compounds. Part a: Group IV Elements
5. Measurement methods, part A;Impurities and Defects in Group IV Elements, IV-IV and III-V Compounds. Part a: Group IV Elements