Nondestructive compositional depth profiling using variable-kinetic energy hard X-ray photoelectron spectroscopy and maximum entropy regularization-Reference-Cited by-同舟云学术

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Nondestructive compositional depth profiling using variable-kinetic energy hard X-ray photoelectron spectroscopy and maximum entropy regularization

Published:2014-04-22 Issue:6 Volume:46 Page:407-417
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Weiland C.¹,Krajewski J.²,Opila R.²,Pallem V.³,Dussarrat C.³,Woicik J. C.¹

Affiliation:

1. National Institute of Standards and Technology; Gaithersburg MD 20899 USA

2. Department of Materials Science and Engineering; University of Delaware; Newark DE 19716 USA

3. Delaware Research and Technology Center; American Air Liquide; Newark DE 19702 USA

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/sia.5517/fullpdf

Reference19 articles.

1. Test on validity of recent formalism for quantitative XPS/AES

2. Profiling nitrogen in ultrathin silicon oxynitrides with angle-resolved x-ray photoelectron spectroscopy

3. Report on the 47th IUVSTA Workshop ‘Angle-Resolved XPS: the current status and future prospects for angle-resolved XPS of nano and subnano films’

4. Surface Composition, Chemistry, and Structure of Polystyrene Modified by Electron-Beam-Generated Plasma

5. Chemically Resolved Depth Profiles Extracted from ARXPS Data Taken on Polystyrene Surfaces Exposed to Nitrogen Plasmas

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1. Angle resolved x-ray photoelectron spectroscopy assessment of the structure and composition of nanofilms—including uncertainties—through the multilayer model;Journal of Vacuum Science & Technology A;2023-10-03

2. High resolution depth profiling using near-total-reflection hard x-ray photoelectron spectroscopy;Journal of Vacuum Science & Technology A;2021-12

3. Microscopic relaxation channels in materials for superconducting qubits;Communications Materials;2021-07-01

4. High quantum efficiency GaAs photocathodes activated with Cs, O2, and Te;AIP Advances;2021-02-01

5. A continuously smooth depth profile model for the interpretation of ARXPS data;Journal of Electron Spectroscopy and Related Phenomena;2017-05

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