Test on validity of recent formalism for quantitative XPS/AES-Reference-Cited by-同舟云学术

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Test on validity of recent formalism for quantitative XPS/AES

Published:1991-03 Issue:1-2 Volume:244 Page:125-134
ISSN:0039-6028
Container-title:Surface Science
language:en
Short-container-title:Surface Science

Author:

Tougaard S,Hansen H.S,Neumann M

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Reference21 articles.

1. Practical Surface Analysis,1983

2. X-ray Photoelectron Spectroscopy of Solid Surfaces;Nefedov,1988

3. Methods for quantitative analysis in XPS and AES

4. The quantitative analysis of surfaces by XPS: A review

5. Quantitation of coverages on rough surfaces by XPS: An overview

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2. Practical guide to the use of backgrounds in quantitative XPS;Journal of Vacuum Science & Technology A;2021-01

3. Effective Attenuation Lengths for Different Quantitative Applications of X-ray Photoelectron Spectroscopy;Journal of Physical and Chemical Reference Data;2020-09-01

4. Study of Tunable Plasmonic, Photoluminscence, and Nonlinear Optical Behavior of Ag Nanoclusters Embedded in a Glass Matrix for Multifunctional Applications;physica status solidi (a);2018-12-28

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