A High‐Performance Ag/TiN/HfO x /HfO y /HfO x /Pt Diffusive Memristor for Calibration‐Free True Random Number Generator-Reference-Cited by-同舟云学术

A High‐Performance Ag/TiN/HfO _x /HfO _y /HfO _x /Pt Diffusive Memristor for Calibration‐Free True Random Number Generator

Published:2022-04-19 Issue:9 Volume:8 Page:2200202
ISSN:2199-160X
Container-title:Advanced Electronic Materials
language:en
Short-container-title:Adv Elect Materials

Author:

Lu Yi‐Fan¹,Li Hao‐Yang¹,Li Yi¹²^ORCID,Li Li‐Heng¹,Wan Tian‐Qing¹³,Yang Ling¹,Zuo Wen‐Bing¹,Xue Kan‐Hao¹²,Miao Xiang‐Shui¹²

Affiliation:

1. Wuhan National Laboratory for Optoelectronics School of Integrated Circuits School of Optical and Electronic Information Huazhong University of Science and Technology Wuhan 430074 China

2. Hubei Yangtze Memory Laboratories Wuhan 430205 China

3. The Hong Kong Polytechnic University Hong Kong 999077 China

Funder

National Natural Science Foundation of China

Publisher

Wiley

Subject

Electronic, Optical and Magnetic Materials

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/aelm.202200202

Reference42 articles.

1. Internet of Things: A survey on the security of IoT frameworks

2. 1.2 Fertilizing AIoT from Roots to Leaves

3. Stochastic Memory Devices for Security and Computing

4. Physical Unbiased Generation of Random Numbers With Coupled Resistive Switching Devices

Cited by 24 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Integration of Ag-based threshold switching devices in silicon microchips;Materials Science and Engineering: R: Reports;2024-12

2. Validation of van der Waals Interface for Enhanced Resistive Switching Performance in Memristor by Using Topotactic Phase Transition Material;ACS Applied Electronic Materials;2024-09-13

3. Memristive True Random Number Generator for Security Applications;Sensors;2024-08-02

4. SnS2 memtransistor-based Lorenz chaotic system for true random number generation;Nano Energy;2024-08

5. Volatile threshold switching devices for hardware security primitives: Exploiting intrinsic variability as an entropy source;Applied Physics Reviews;2024-05-23