Memristive True Random Number Generator for Security Applications

Author:

Zhao Xianyue12ORCID,Chen Li-Wei3ORCID,Li Kefeng12,Schmidt Heidemarie12,Polian Ilia3ORCID,Du Nan12ORCID

Affiliation:

1. Institute for Solid State Physics, Friedrich Schiller University Jena, 07743 Jena, Germany

2. Department of Quantum Detection, Leibniz Institute of Photonic Technology (IPHT), 07745 Jena, Germany

3. Institute of Computer Science and Computer Engineering, University of Stuttgart, 70569 Stuttgart, Germany

Abstract

This study explores memristor-based true random number generators (TRNGs) through their evolution and optimization, stemming from the concept of memristors first introduced by Leon Chua in 1971 and realized in 2008. We will consider memristor TRNGs coming from various entropy sources for producing high-quality random numbers. However, we must take into account both their strengths and weaknesses. The comparison with CMOS-based TRNGs will serve as an illustration that memristor TRNGs stand out due to their simpler circuits and lower power consumption— thus leading us into a case study involving electroless YMnO3 (YMO) memristors as TRNG entropy sources that demonstrate good security properties by being able to produce unpredictable random numbers effectively. The end of our analysis sees us pinpointing challenges: post-processing algorithm optimization coupled with ensuring reliability over time for memristor-based TRNGs aimed at next-generation security applications.

Funder

German Research Foundation (DFG) Projects MemDPU

MemCrypto

German Research Foundation (DFG) Project MemCrypto

Publisher

MDPI AG

Reference57 articles.

1. Memristor-the missing circuit element;Chua;IEEE Trans. Circuit Theory,1971

2. The missing memristor found;Strukov;Nature,2008

3. A ferroelectric memristor;Chanthbouala;Nat. Mater.,2012

4. Memristor-based neural networks;Thomas;J. Phys. D Appl. Phys.,2013

5. Memristor-based material implication (IMPLY) logic: Design principles and methodologies;Kvatinsky;IEEE Trans. Very Large Scale Integr. (VLSI) Syst.,2013

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