Conversions from Normal to Abnormal Current‐Dependent ISC and from Abnormal to Normal Current‐Dependent RISC Processes in Exciplex‐Based OLEDs-Reference-Cited by-同舟云学术

Conversions from Normal to Abnormal Current‐Dependent ISC and from Abnormal to Normal Current‐Dependent RISC Processes in Exciplex‐Based OLEDs

Published:2022-04-20 Issue:16 Volume:9 Page:2200155
ISSN:2196-7350
Container-title:Advanced Materials Interfaces
language:en
Short-container-title:Adv Materials Inter

Author:

Zhao Xi¹,Chen Jing¹,Tang Xiantong¹,Wu Fengjiao¹,Ning Yaru¹,Chen Xiaoli¹,Xiong Zuhong¹^ORCID

Affiliation:

1. Chongqing Key Laboratory of Micro and Nano Structure Optoelectronics School of Physical Science and Technology Southwest University Chongqing 400715 China

Funder

National Natural Science Foundation of China

Publisher

Wiley

Subject

Mechanical Engineering,Mechanics of Materials

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/admi.202200155

Reference48 articles.

1. Routes for Efficiency Enhancement in Fluorescent TADF Exciplex Host OLEDs Gained from an Electro‐Optical Device Model

2. Interface Effect on Efficiency Loss in Organic Light Emitting Diodes with Solution Processed Emitting Layers

3. Spectrally resolved hyperfine interactions between polaron and nuclear spins in organic light emitting diodes: Magneto-electroluminescence studies

4. Evidence of the Reverse Intersystem Crossing in Intra-Molecular Charge-Transfer Fluorescence-Based Organic Light-Emitting Devices Through Magneto-Electroluminescence Measurements

5. Magnetic Field Effects on Singlet Fission and Fluorescence Decay Dynamics in Amorphous Rubrene

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