Raman characterization of the structural evolution in amorphous and partially nanocrystalline hydrogenated silicon thin films prepared by PECVD
Author:
Publisher
Wiley
Subject
Spectroscopy,General Materials Science
Link
http://onlinelibrary.wiley.com/wol1/doi/10.1002/jrs.2711/fullpdf
Reference23 articles.
1. Let there be light
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