Investigation of p-Type MOS Structure Irradiated with 23 MeV Electrons
Author:
Publisher
Wiley
Subject
Polymers and Plastics,Condensed Matter Physics
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1. High-dose MeV electron irradiation of Si-SiO2 structures implanted with high doses Si+;Journal of Physics: Conference Series;2018-03
2. Electrical characterization of thin nanoscale SiOx layers grown on plasma hydrogenated silicon;Journal of Physics: Conference Series;2018-03
3. Interface characterization of nanoscale SiOxlayers grown on RF plasma hydrogenated silicon;Journal of Physics: Conference Series;2016-03
4. High energy electron-beam irradiation effects in Si-SiOxstructures;Journal of Physics: Conference Series;2016-02-09
5. Analysis of A-DLTS spectra of MOS structures with thin NAOS SiO2 layers;Open Physics;2011-01-01
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