RGB‐Color Image Analysis for Determination of Birefringence of Micro‐Films and Columnar Coatings

Author:

Ryu Meguya1ORCID,Han Molong2,Grineviciute Lina3,Hu Jingwen2,Moein Tania2,Honda Reo4,Katkus Tomas2,Tobin Mark J.5ORCID,Vongsvivut Jitraporn5,Tolenis Tomas36,Nishijima Yoshiaki78,Ng Soon Hock2,Juodkazis Saulius29ORCID,Morikawa Junko49

Affiliation:

1. National Metrology Institute of Japan (NMIJ) National Institute of Advanced Industrial Science and Technology (AIST) Tsukuba Central 3, 1‐1‐1, Umezono Tsukuba 305‐8563 Japan

2. Optical Sciences Centre and ARC Training Centre in Surface Engineering for Advanced Materials (SEAM) School of Science Swinburne University of Technology Hawthorn Victoria 3122 Australia

3. Department of Laser Technologies Center for Physical Sciences and Technology Savanoriu Ave. 231 Vilnius LT‐02300 Lithuania

4. CREST‐JST and Tokyo Institute of Technology, School of Materials and Chemical Technology Meguro‐ku Tokyo 152‐8550 Japan

5. Infrared Microspectroscopy (IRM) Beamline ANSTO‐Australian Synchrotron 800 Blackburn Road Clayton Victoria 3168 Australia

6. ELI Beamlines Institute of Physics The Czech Academy of Sciences Za Radnicí 835 Dolní Břežany 252 41 Czech Republic

7. Department of Electrical and Computer Engineering Graduate School of Engineering Yokohama National University 79‐5 Tokiwadai Hodogaya‐ku Yokohama 240‐8501 Japan

8. Institute of Advanced Sciences Yokohama National University 79‐5 Tokiwadai Hodogaya‐ku Yokohama 240‐8501 Japan

9. WRH Program, International Research Frontiers Initiative (IRFI), Tokyo Institute of Technology Nagatsuta‐cho, Midori‐ku Yokohama City 226‐8503 Japan

Funder

Australian Research Council

Japan Society for the Promotion of Science London

Lietuvos Mokslo Taryba

Publisher

Wiley

Subject

Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference34 articles.

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