Three-port cascade de-embedding methodology with the dangling leg effect considered for pHEMT electron trapping characterization at microwave frequency-Reference-Cited by-同舟云学术

Three-port cascade de-embedding methodology with the dangling leg effect considered for pHEMT electron trapping characterization at microwave frequency

Published:2013-11-25 Issue:1 Volume:56 Page:77-83
ISSN:0895-2477
Container-title:Microwave and Optical Technology Letters
language:en
Short-container-title:Microw. Opt. Technol. Lett.

Author:

Lee Chie-In¹²,Lin Wei-Cheng¹,Lin Yan-Ting¹

Affiliation:

1. Department of Electrical Engineering; National Sun Yat-Sen University; Kaohsiung 80424 Taiwan

2. Institute of Communications Engineering; National Sun Yat-Sen University; Kaohsiung 80424 Taiwan

Funder

National Science Council of Taiwan

Publisher

Wiley

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/mop.28081/fullpdf

Reference14 articles.

1. Applying line-series-shunt calibration to one-tier on-wafer device de-embedding up to millimeter waves;Huang;Microwave Opt Technol Lett,2013

2. A novel four-port de-embedding method and the parametric extraction of MOSFETs;Lee;In Proceedings of Progress in Electromagnetic Research Symposium,2010

3. A shield-based three-port de-embedding method for microwave on-wafer characterization of deep-submicrometer silicon MOSFETs;Cho;IEEE Trans Microwave Theory Tech,2005

4. A “thru-short” method for noise de-embedding of MOSFETs;Nan;Microwave Opt Technol Lett,2009

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