Temperature dependence on RF avalanche breakdown of RF mosfets in the impact ionization region

Author:

Lee Chie-In12,Lin Wei-Cheng1,Lin Yan-Ting1

Affiliation:

1. Department of Electrical Engineering; National Sun Yat-Sen University; Kaohsiung 80424 Taiwan

2. Institute of Communications Engineering; National Sun Yat-Sen University; Kaohsiung 80424 Taiwan

Funder

National Science Council of Taiwan

Publisher

Wiley

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference20 articles.

1. Zero-temperature-coefficient biasing point of a fully-depleted SOI MOSFET;Tan;Microwave Opt Technol Lett

2. Partially depleted SOI versus deep N-well protected bulk-Si MOSFETs: A high-temperature RF study for low-voltage low-power applications;Emam;IEEE Trans Microwave Theory Techn

3. Temperature dependence of the power gain and scattering parameters S11 and S22 of an RF nMOSFET with advanced RF-CMOS technology;Lin;Microwave Opt Technol Lett

4. A full X-band power amplifier with an integrated guanella-type transformer and a predistortion linearizer in 0.18-μM CMOS;Chung;Microwave Opt Technol Lett

5. A single-chip RF power amplifier with integrated impedance matching Wilkinson power dividers for 5.2 GHz WLAN applications;Kaymaksut;Microwave Opt Technol Lett

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