A shield-based three-port de-embedding method for microwave on-wafer characterization of deep-submicrometer silicon MOSFETs

Author:

Ming-Hsiang Cho ,Guo-Wei Huang ,Lin-Kun Wu ,Chia-Sung Chiu ,Yueh-Hua Wang ,Kun-Ming Chen ,Hua-Chou Tseng ,Tsun-Lai Hsu

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Radiation

Cited by 21 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. A circuit‐topology and cascade‐based de‐embedding for GaN transistor microwave characterization;Microwave and Optical Technology Letters;2022-07-13

2. An Improved Ultrawideband Open-Short De-Embedding Method Applied up to 220 GHz;IEEE Transactions on Components, Packaging and Manufacturing Technology;2018-02

3. A De-Embedding Technique of a Three-Port Network with Two Ports Coupled;Journal of electromagnetic engineering and science;2015-10-31

4. A Simple and Accurate Pad-Thru-Short Deembedding Method Based on Systematic Analysis for RF Device Characterization;IEEE Transactions on Electron Devices;2015-01

5. Design Considerations for Complicated Antenna Systems on a Simple De-Embedding Method;IEEE Antennas and Wireless Propagation Letters;2014

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