Structural and optical properties of magnetron sputtered and pulsed beam annealed Ge/Si layers-Reference-Cited by-同舟云学术

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Structural and optical properties of magnetron sputtered and pulsed beam annealed Ge/Si layers

Published:2013-11-11 Issue:12 Volume:10 Page:1824-1827
ISSN:1862-6351
Container-title:physica status solidi (c)
language:en
Short-container-title:Phys. Status Solidi C

Author:

Galkin K. N.,Batalov R. I.,Bayazitov R. M.,Novikov H. A.,Shustov V. A.,Bizyaev D. A.,Gaiduk P. I.,Ivlev G. D.,Prokopyev S. L.

Publisher

Wiley

Subject

Condensed Matter Physics

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Effect of gamma irradiation on microstructural evolution and mechanical properties of Sn3Ag0.5Cu solder joints;Journal of Materials Research and Technology;2023-05

2. Modifications of structural, chemical, and electrical characteristics of Er2O3/Si interface under Co-60 gamma irradiation;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2018-03

3. Raman and photoluminescence spectroscopy of SiGe layer evolution on Si(100) induced by dewetting;Journal of Applied Physics;2018-01-07

4. Investigation of the microstructure and optical properties of Ge films grown by DC magnetron sputtering and in situ annealing;Japanese Journal of Applied Physics;2016-05-20

5. Pulsed modification of germanium films on silicon, sapphire, and quartz substrates: Structure and optical properties;Semiconductors;2015-06

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