Critical Layer Thickness Analysis of Vertically Stacked Hyperbolic Metamaterials for Effective Negative Refraction Generation-Reference-Cited by-同舟云学术

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Critical Layer Thickness Analysis of Vertically Stacked Hyperbolic Metamaterials for Effective Negative Refraction Generation

Published:2020-09-16 Issue:11 Volume:3 Page:2000138
ISSN:2513-0390
Container-title:Advanced Theory and Simulations
language:en
Short-container-title:Adv. Theory Simul.

Author:

Cho Hanlyun¹,So Sunae¹,Badloe Trevon¹,Bang Sanghun¹,Rho Junsuk¹²^ORCID

Affiliation:

1. Department of Mechanical Engineering Pohang University of Science and Technology 77 Cheongam‐ro Nam‐gu Pohang 37673 Republic of Korea

2. Department of Chemical Engineering Pohang University of Science and Technology 77 Cheongam‐ro Nam‐gu Pohang 37673 Republic of Korea

Funder

National Research Foundation

Publisher

Wiley

Subject

Multidisciplinary,Modelling and Simulation,Numerical Analysis,Statistics and Probability

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/adts.202000138

Reference45 articles.

1. Negative Refraction Makes a Perfect Lens

2. Metamaterials and Negative Refractive Index

3. Three-dimensional optical metamaterial with a negative refractive index

4. All-Angle Broadband Negative Refraction of Metal Waveguide Arrays in the Visible Range: Theoretical Analysis and Numerical Demonstration

5. Symmetry breaking and optical negative index of closed nanorings

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1. A solid-solution approach for high frequency 3-dimensional isotropic negative-refractive-index metamaterials based on microwave ceramics;Ceramics International;2024-01

2. Achieving super resolution lithography based on bulk plasmon polaritons of hyperbolic metamaterials;Optical Materials;2022-08

3. Negative index metamaterial at ultraviolet range for subwavelength photolithography;Nanophotonics;2022-03-02

4. Hyperbolic metamaterials: fusing artificial structures to natural 2D materials;eLight;2022-01-10

5. A planar ultraviolet objective lens for optical axis free imaging nanolithography by employing optical negative refraction;Nanoscale Advances;2022

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