Doping Ability Modulated by Interlayer Coupling in AA′ and AB Stacked Bilayer V–WS2 Grown with Chemical Vapor Deposition

Author:

Tian Chuang12,Sui Yanping12,Xiao Runhan12,Feng Yuhan12,Liu Jiawen12,Wang Haomin12,Zhao Sunwen12,Wang Shuang12,Li Pai12,Yu Guanghui12ORCID

Affiliation:

1. State Key Laboratory of Integrated Circuit Materials Shanghai Institute of Microsystem and Information Technology Chinese Academy of Sciences Shanghai 200050 China

2. Center of Materials Science and Optoelectronics Engineering University of Chinese Academy of Sciences Beijing 100049 China

Abstract

AbstractDoping in transition metal dichalcogenide (TMD) has received extensive attention for its prospect in the application of photoelectric devices. Currently researchers focus on the doping ability and doping distribution in monolayer TMD and have obtained a series of achievements. Bilayer TMD has more excellent properties compared with monolayer TMD. Moreover, bilayer TMD with different stacking structures presents varying performance due to the difference in interlayer coupling. Herein, this work focuses on doping ability of dopants in different bilayer stacking structures that has not been studied yet. Results of this work show that the doping ability of V atoms in bilayer AA′ and AB stacked WS2 is different, and the doping concentration of V atoms in AB stacked WS2 is higher than in AA′ stacked WS2. Moreover, dopants from top and bottom layer can be distinguished by scanning transmission electron microscopy (STEM) image. Density functional theory (DFT) calculation further confirms the doping rule. This study reveals the mechanism of the different doping ability caused by stacking structures in bilayer TMD and lays a foundation for further preparation of controllable‐doping bilayer TMD materials.

Funder

National Natural Science Foundation of China

Science and Technology Commission of Shanghai Municipality

Publisher

Wiley

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