Impact of Phase‐Change Memory Flicker Noise and Weight Drift on Analog Hardware Inference for Large‐Scale Deep Learning Networks-Reference-Cited by-同舟云学术

Impact of Phase‐Change Memory Flicker Noise and Weight Drift on Analog Hardware Inference for Large‐Scale Deep Learning Networks

Published:2022-02-23 Issue:5 Volume:4 Page:2100179
ISSN:2640-4567
Container-title:Advanced Intelligent Systems
language:en
Short-container-title:Advanced Intelligent Systems

Author:

Han Jin-Ping¹^ORCID,Rasch Malte J.¹,Liu Zuoguang²,Solomon Paul¹,Brew Kevin²,Cheng Kangguo²,Ok Injo²,Chan Victor²,Longstreet Michael³,Kim Wanki¹,Bruce Robert L.¹,Cheng Cheng-Wei¹,Saulnier Nicole²,Narayanan Vijay¹

Affiliation:

1. IBM T. J. Watson Research Center 1101 Kitchawan Road Yorktown Heights NY 10598 USA

2. IBM Research - Albany Nano Tech 257 Fuller Road Albany NY 12203 USA

3. IBM System 2070 Route 52 Hopewell Junction NY 12533 USA

Publisher

Wiley

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/aisy.202100179

Reference33 articles.

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