Impact of Phase-Change Memory Drift on Energy Efficiency and Accuracy of Analog Compute-in-Memory Deep Learning Inference (Invited)

Author:

Frank Martin M.1,Li Ning1,Rasch Malte J.1,Jain Shubham1,Chen Ching-Tzu1,Muralidhar Ramachandran1,Han Jin-Ping1,Narayanan Vijay1,Philip Timothy M.2,Brew Kevin2,Simon Andrew2,Saraf Iqbal2,Saulnier Nicole2,Boybat Irem3,Woźniak StanisŁaw3,Sebastian Abu3,Narayanan Pritish4,Mackin Charles4,Chen An4,Tsai Hsinyu4,Burr Geoffrey W.4

Affiliation:

1. IBM T. J. Watson Research Center,NY,USA

2. IBM Research - Albany,Albany,NY,USA

3. IBM Research - Zurich,Rüschlikon,Switzerland

4. IBM Research - Almaden,San Jose,CA,USA

Publisher

IEEE

Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Prospects and challenges of electrochemical random-access memory for deep-learning accelerators;Current Opinion in Solid State and Materials Science;2024-09

2. Resistive Processing Unit-based On-chip ANN Training with Digital Memory;2024 IEEE 6th International Conference on AI Circuits and Systems (AICAS);2024-04-22

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