STM characterization of InP gratings for DFB laser fabrication-Reference-Cited by-同舟云学术

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STM characterization of InP gratings for DFB laser fabrication

Published:1994-07 Issue:1-12 Volume:22 Page:296-299
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Meneghini G.,Picotto G. B.,Gentili M.,Grella L.

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference21 articles.

1. Analysis of grating-coupled radiation in GaAs:GaAlAs lasers and waveguides - I

2. Linewidth Measurement by a New Scanning Tunneling Microscope

3. Scanning tunneling microscopy: Critical dimension and surface roughness analysis

4. Characterization of scanning probe microscope tips for linewidth measurement

5. Reconstruction of STM and AFM images distorted by finite-size tips

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. STM carbon nanotube tips fabrication for critical dimension measurements;Sensors and Actuators A: Physical;2005-09

2. Stm Tips Fabrication for Critical Dimension Measurements;Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials

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