STM carbon nanotube tips fabrication for critical dimension measurements

Author:

Pasquini A.,Picotto G.B.,Pisani M.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Metals and Alloys,Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation,Electronic, Optical and Magnetic Materials

Reference7 articles.

1. Growth process conditions of vertically aligned carbon nanotubes using plasma enhanced chemical vapor deposition;Chhowalla;J. Appl. Phys.,2001

2. S. Musso, G. Fanchini, A. Tagliaferro, Growth of vertically aligned carbon nanotubes by CVD sublimation of solid carbon sources, contribution accepted for the Diamond Conference 2005, Toulouse, France, 11–16 September.

3. Carbon nanotubes as probes for atomic force microscopy;Stevens;Nanotechnology,2000

4. Carbon nanotube tip for scanning tunneling microscope;Mizutani;Jpn. J. Appl. Phys.,2001

5. STM tips fabrication for critical dimension measurements;Pasquini,2002

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