On the applicability of tougaard background subtraction to general auger spectra
Author:
Publisher
Wiley
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry
Reference14 articles.
1. Application of Tougaard background subtraction to Auger spectra. I: Silicon, SiO2 and Si3N4
2. Application of Tougaard background subtraction to Auger spectra. II. Ti and Co silicides
3. Peak energies and relative sensitivity factors in N(E) Auger spectra
4. Data compilations: their use to improve measurement certainty in surface analysis by aes and xps
5. and in Handbook of Auger Electron Spectroscopy. JEOL, Tokyo (1982).
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1. Study of oxygen chemisorption on the GaN(0001)‐(1×1) surface;Journal of Applied Physics;1996-07-15
2. Estimation of Excitation Depth Distribution from Electron-excited Auger Spectra of Iron Using Peak Shape Analysis;Surface and Interface Analysis;1996-03
3. Surface Analysis: X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy;Analytical Chemistry;1996-01-01
4. Quantitative analysis of the composition of silicon-germanium alloys by AES;Journal of Electron Spectroscopy and Related Phenomena;1995-12
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