Application of Tougaard background subtraction to Auger spectra. II. Ti and Co silicides
Author:
Publisher
Wiley
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry
Reference16 articles.
1. Application of Tougaard background subtraction to Auger spectra. I: Silicon, SiO2 and Si3N4
2. Quantitative analysis of the inelastic background in surface electron spectroscopy
3. Quantitative AES analysis of Ti silicide and Co silicide films
4. and Surf. Interface Anal., to be published (1991).
5. Low energy inelastic electron scattering properties of noble and transition metals
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