Quantitative x‐ray photoelectron spectroscopy of CuAu, CoNi, and CuNi alloys using theoretical photoionization cross sections or reference spectra
Author:
Publisher
American Vacuum Society
Subject
Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Link
http://avs.scitation.org/doi/pdf/10.1116/1.579209
Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. XPS for non-destructive depth profiling and 3D imaging of surface nanostructures;Analytical and Bioanalytical Chemistry;2010-01-21
2. Quantitative investigation of amorphous Fe/Ge and Fe/Si by inelastic peak shape analysis;Surface Science;2000-01
3. Quantitative XPS Measurements of Some Oxides, Sulphides and Complex Minerals;Surface and Interface Analysis;1996-09-16
4. Surface nanostructure determination by x‐ray photoemission spectroscopy peak shape analysis;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;1996-05
5. Surface Analysis: X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy;Analytical Chemistry;1996-01-01
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