Determination of tolerance limits for the reliability of semiconductor devices using longitudinal data
Author:
Affiliation:
1. Institute of Statistics and Operations Research; University of Graz, Universitätsstraße 15/E3; 8010 Graz Austria
2. Infineon Technologies Austria AG; Siemensstraße 2, 9500 Villach Austria
Publisher
Wiley
Subject
Management Science and Operations Research,Safety, Risk, Reliability and Quality
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