X‐Ray Microscopy of Halide Perovskites: Techniques, Applications, and Prospects-Reference-Cited by-同舟云学术

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X‐Ray Microscopy of Halide Perovskites: Techniques, Applications, and Prospects

Published:2020-01-29 Issue:26 Volume:10 Page:1903170
ISSN:1614-6832
Container-title:Advanced Energy Materials
language:en
Short-container-title:Adv. Energy Mater.

Author:

Kodur Moses¹,Kumar Rishi E.²,Luo Yanqi³,Cakan Deniz N.³,Li Xueying²,Stuckelberger Michael⁴,Fenning David P.¹²³^ORCID

Affiliation:

1. Chemical Engineering ProgramUniversity of California San Diego La Jolla San Diego CA 92093 USA

2. Materials Science ProgramUniversity of California San Diego La Jolla San Diego CA 92093 USA

3. Department of NanoengineeringUniversity of California San Diego La Jolla San Diego CA 92093 USA

4. Deutsches Elektronen – Synchrotron DESY 22607 Hamburg Germany

Funder

California Energy Commission

National Science Foundation

Publisher

Wiley

Subject

General Materials Science,Renewable Energy, Sustainability and the Environment

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/aenm.201903170

Reference176 articles.

1. Organic–Inorganic Perovskites: Structural Versatility for Functional Materials Design

2. Polyelemental, Multicomponent Perovskite Semiconductor Libraries through Combinatorial Screening

3. Electron-Hole Diffusion Lengths Exceeding 1 Micrometer in an Organometal Trihalide Perovskite Absorber

4. Long-Range Balanced Electron- and Hole-Transport Lengths in Organic-Inorganic CH 3 NH 3 PbI 3

5. Nanocrystals of Cesium Lead Halide Perovskites (CsPbX3, X = Cl, Br, and I): Novel Optoelectronic Materials Showing Bright Emission with Wide Color Gamut

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1. Sub‐10 nm Lanthanide‐Doped Lu₆O₅F₈ Nanoscintillators for Real‐Time High‐Resolution Dynamic 3D X‐Ray Imaging;Advanced Functional Materials;2024-07-22

2. Novel Detection Scheme for Temporal and Spectral X-Ray Optical Analysis: Study of Triple-Cation Perovskites;PRX Energy;2024-06-27

3. Halide perovskite x-ray detectors: Fundamentals, progress, and outlook;Applied Physics Reviews;2024-06-01

4. Volumetric nondestructive metrology for 3D semiconductor packaging: A review;Measurement;2024-02

5. Numerical analysis of X-ray multilayer Fresnel zone plates with high aspect ratios;Laser and Particle Beams;2024

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