Efficiency of automated peak identification with daily used commercial software for X-ray photoelectron spectra - report from VAMAS/TWA 2/A 9 project-Reference-Cited by-同舟云学术

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Efficiency of automated peak identification with daily used commercial software for X-ray photoelectron spectra - report from VAMAS/TWA 2/A 9 project

Published:2013-03-06 Issue:7 Volume:45 Page:1174-1181
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Suzuki Mineharu¹,Fukushima Sei²,Tanuma Shigeo²

Affiliation:

1. Park Systems Japan Inc.; 1-17-1 Kanda-Nishikicho Chiyoda-ku Tokyo 101-0054 Japan

2. National Institute for Materials Science; 1-2-1 Sengen Tsukuba Ibaraki 305-0047 Japan

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/sia.5245/fullpdf

Reference8 articles.

1. Assessment of Peak Detection Algorithm Proposed by ISO/TC201/SC3 for X-ray Photoelectron Spectroscopy

2. http://www.ulvac-phi.co.jp/

3. http://www.casaxps.com/

4. http://www.xpsdata.com/frmain.htm

5. Efficiency of visual peak detection in X-ray photoelectron spectra

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. International standardization and metrology as tools to address the comparability and reproducibility challenges in XPS measurements;Journal of Vacuum Science & Technology A;2020-03

2. Quantitative analysis of trace levels of surface contamination by X-ray photoelectron spectroscopy. Part I: Statistical uncertainty near the detection limit;Surface and Interface Analysis;2017-09-29

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