Efficiency of visual peak detection in X-ray photoelectron spectra-Reference-Cited by-同舟云学术

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Efficiency of visual peak detection in X-ray photoelectron spectra

Published:2008-10 Issue:10 Volume:40 Page:1337-1343
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Suzuki Mineharu,Fukushima Sei,Tanuma Shigeo

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference4 articles.

1. Assessment of Peak Detection Algorithm Proposed by ISO/TC201/SC3 for X-ray Photoelectron Spectroscopy

2. http://www.phi.com/(in English), www.ulvac-phi.com/(in Japanese), [Last accessed 1 June 2008].

3. http://www.casaxps.com/,[Last accessed 1 June 2008].

4. http://www.xpsdata.com/,[Last accessed 1 June 2008].

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Quantitative analysis of trace levels of surface contamination by X-ray photoelectron spectroscopy. Part I: Statistical uncertainty near the detection limit;Surface and Interface Analysis;2017-09-29

2. Efficiency of automated peak identification with daily used commercial software for X-ray photoelectron spectra - report from VAMAS/TWA 2/A 9 project;Surface and Interface Analysis;2013-03-06

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