Quantitative analysis of trace levels of surface contamination by X-ray photoelectron spectroscopy. Part I: Statistical uncertainty near the detection limit-Reference-Cited by-同舟云学术

Quantitative analysis of trace levels of surface contamination by X-ray photoelectron spectroscopy. Part I: Statistical uncertainty near the detection limit

Published:2017-09-29 Issue:12 Volume:49 Page:1187-1205
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf Interface Anal

Author:

Hill Shannon B.¹^ORCID,Faradzhev Nadir S.¹,Powell Cedric J.¹^ORCID

Affiliation:

1. National Institute of Standards and Technology; Gaithersburg MD 20899 USA

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference20 articles.

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2. Quantitative analysis of trace levels of surface contamination by X-ray photoelectron spectroscopy. Part II: Systematic uncertainties and absolute quantification;Faradzhev;Surf Interface Anal,2017

3. Limits for qualitative detection and quantitative determination. Application to radiochemistry;Currie;Anal Chem,1968

4. Detection and quantification limits: origins and historical overview;Currie;Anal Chim Acta,1999

5. ISO 18115-1, Surface chemical analysis-vocabulary, part 1-general terms and terms used in spectroscopy

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