Intensity calibration and sensitivity factors for XPS instruments with monochromatic Ag Lα and Al Kα sources-Reference-Cited by-同舟云学术

Intensity calibration and sensitivity factors for XPS instruments with monochromatic Ag Lα and Al Kα sources

Published:2019-04-26 Issue:7 Volume:51 Page:763-773
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf Interface Anal

Author:

Shard Alexander G.¹^ORCID,Counsell Jonathan D.P.²,Cant David J. H.¹^ORCID,Smith Emily F.³^ORCID,Navabpour Parnia⁴,Zhang Xiaoling⁴,Blomfield Christopher J.²

Affiliation:

1. National Physical LaboratoryChemical and Biological Sciences Middlesex UK

2. Kratos Analytical Ltd Manchester UK

3. Nanoscale and Microscale Research Centre, School of ChemistryUniversity of Nottingham, University Park Nottingham UK

4. West Stone HouseTeer Coatings Ltd Droitwich UK

Funder

Engineering and Physical Sciences Research Council

Innovate UK

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/sia.6647

Reference32 articles.

1. Monochromatized Ag L? X-rays as a source for higher energy XPS

2. High energy xps using a monochromated Ag Lα source: resolution, sensitivity and photoelectric cross sections

3. The use of monochromatic Ag Lα radiation to study relaxation energy differences in X-ray photoelectron spectroscopy of alkali metal chlorides

4. XPS examination of the native oxide layer on Kovar using aluminium, magnesium and silver x-ray sources

5. An ARXPS and ERXPS study of quaternary ammonium and phosphonium ionic liquids: utilising a high energy Ag Lα′ X-ray source

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