Robust inference for one‐shot device testing data under exponential lifetime model with multiple stresses
Author:
Affiliation:
1. Department of Mathematics and Statistics McMaster University Hamilton Ontario Canada
2. Department of Statistics and O.R. I UCM Madrid Spain
3. Department of Financial and Actuarial Economics and Statistics UCM Madrid Spain
Funder
Ministerio de Ciencia, Innovacion y Universidades
Publisher
Wiley
Subject
Management Science and Operations Research,Safety, Risk, Reliability and Quality
Link
https://onlinelibrary.wiley.com/doi/pdf/10.1002/qre.2665
Reference20 articles.
1. The Bayesian approach for highly reliable electro-explosive devices using one-shot device testing
2. Warranty calculations for missiles with only current-status data, using Bayesian methods
3. Monitoring and maintenance of spares and one shot devices
4. EM algorithm for one-shot device testing under the exponential distribution
5. Multiple-Stress Model for One-Shot Device Testing Data Under Exponential Distribution
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