The Bayesian approach for highly reliable electro-explosive devices using one-shot device testing
Author:
Publisher
Informa UK Limited
Subject
Applied Mathematics,Statistics, Probability and Uncertainty,Modeling and Simulation,Statistics and Probability
Link
http://www.tandfonline.com/doi/pdf/10.1080/00949650802142592
Reference13 articles.
1. Step-Stress Accelerated Degradation Analysis for Highly Reliable Products
2. Weibull Analysis of Reliability Data with Few or No Failures
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