1. 2007
2. , , , and , Divergent Illumination Optical Testing Device; Proc. 13rd Advanced Equipment Control/Advanced Process Control Conference, October 6–11, 2001, Banff, Canada, poster.
3. , , , , and ; Divergent Illumination Optical Testing Device, Proc. 3rd European Advanced Equipment Control/Advanced Process Control Conference, April 10–12, 2002, Dresden, Germany, poster
4. , , and , Homogeneity check of ion implantation in silicon by wide-angle ellipsometry, 4th Workshop Ellipsometry, 20–22 February (2006), Berlin, Germany, poster.
5. Imaging ellipsometry revisited: Developments for visualization of thin transparent layers on silicon substrates