1. Horváth, Z Gy; Juhász, G; Fried, M; Major, C; Petrik, P, Imaging optical inspection device with a pinhole camera, EP2160591B1, NSZO: G01N21/8422, Europe
2. Non-collimated beam ellipsometry;Juhász,2008
3. Wide angle beam ellipsometry for extremely large samples;Major,2008
4. Application of wide-angle beam spectroscopic ellipsometry for quality control in solar cell production;Major,2009
5. Expanded beam (macro-imaging) ellipsometry;Fried,2011