Quantitative ARXPS investigation of systems with ultrathin aluminium oxide layers-Reference-Cited by-同舟云学术

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Quantitative ARXPS investigation of systems with ultrathin aluminium oxide layers

Published:2004 Issue:13 Volume:36 Page:1600-1608
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Kozłowska M.,Reiche R.,Oswald S.,Vinzelberg H.,Hübner R.,Wetzig K.

Funder

Deutsche Forschungsgemeinschaft

Saxony Ministry SMWA

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference28 articles.

1. Compositional, structural, and electrical characterization of plasma oxidized thin aluminum layers for spin-tunnel junctions

2. Asymmetric bias voltage dependence of the magnetoresistance of Co/Al2O3/Co magnetic tunnel junctions: Variation with the barrier oxidation time

3. Analytical investigations of tunnel magnetoresistance layers

4. http://www.npl.co.uk

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