Thickness Identification of Thin InSe by Optical Microscopy Methods-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Thickness Identification of Thin InSe by Optical Microscopy Methods

Published:2020-09-28 Issue:2 Volume:1 Page:2000025
ISSN:2699-9293
Container-title:Advanced Photonics Research
language:en
Short-container-title:Adv Photo Res

Author:

Zhao Qinghua¹²³,Puebla Sergio³,Zhang Wenliang³,Wang Tao¹²,Frisenda Riccardo³^ORCID,Castellanos-Gomez Andres³^ORCID

Affiliation:

1. State Key Laboratory of Solidification Processing Northwestern Polytechnical University Xi'an 710072 P. R. China

2. Key Laboratory of Radiation Detection Materials and Devices Ministry of Industry and Information Technology Xi'an 710072 P. R. China

3. Materials Science Factory Instituto de Ciencia de Materiales de Madrid (ICMM-CSIC) Madrid E-28049 Spain

Funder

Ministerio de Economía, Industria y Competitividad, Gobierno de España

China Sponsorship Council

Northwestern Polytechnical University

Publisher

Wiley

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/adpr.202000025

Reference59 articles.

1. 2D materials and van der Waals heterostructures

2. A review on mechanics and mechanical properties of 2D materials—Graphene and beyond

3. Two-dimensional semiconductors for transistors

4. 2D Materials for Optical Modulation: Challenges and Opportunities

5. Photonics and optoelectronics of 2D semiconductor transition metal dichalcogenides

Cited by 14 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Layer Dependence of Complex Refractive Index in CrSBr;Materials;2024-07-11

2. Understanding the Origin and Implication of the Indirect-to-Direct Bandgap Transition in Multilayer InSe;The Journal of Physical Chemistry C;2024-05-03

3. Apparent color and Raman vibrational modes of the high-temperature superconductor Bi₂Sr₂CaCu₂O 8+δ exfoliated flakes;2D Materials;2024-03-25

4. Research progress on two-dimensional indium selenide crystals and optoelectronic devices;Journal of Materials Chemistry A;2024

5. Techniques to Characterize the Photoactivity of Semiconductor Materials Defining Performance in Advanced Oxidation Processes and Fuel Generation;Trends and Innovations in Energetic Sources, Functional Compounds and Biotechnology;2023-12-01

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3