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Numerical approximation of AR-XPS spectra for rough surfaces considering the effect of electron shadowing

  • Published:2014-08-07 Issue:1 Volume:47 Page:15-21
  • ISSN:0142-2421
  • Container-title:Surface and Interface Analysis
  • language:en
  • Short-container-title:Surf. Interface Anal.

Author:

Bianchi D.1,Katona L.1,Brenner J.1,Vorlaufer G.1,Vernes A.12,Werner W. S. M.2

Affiliation:

1. Austrian Center of Competence for Tribology; Viktor-Kaplan-Straße 2 Wiener Neustadt 2700 Austria

2. Institute of Applied Physics; Vienna University of Technology; Wiedner Hauptstraße 8-10 /134, 1040 Vienna Austria

Funder

AC2T research GmbH

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference22 articles.

1. An ARXPS primer;Paynter;J. Electron Spectros. Relat. Phenomena,2009

2. Surface analysis and angular distributions in x-ray photoelectron spectroscopy;Fadley;J. Electron Spectros. Relat. Phenomena,1974

3. Angle-resolved XPS depth-profiling strategies;Cumpson;Appl. Surf. Sci.,1999

4. Electron spectroscopy of corrugated solid surfaces.;Zemek;Anal. Sci.,2010

5. Thickness determination of uniform overlayers on rough substrates by angle-dependent XPS;Gunter;Appl. Surf. Sci.,1995

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