Electron Spectroscopy of Corrugated Solid Surfaces-Reference-Cited by-同舟云学术

Electron Spectroscopy of Corrugated Solid Surfaces

Published:2010 Issue:2 Volume:26 Page:177-186
ISSN:0910-6340
Container-title:Analytical Sciences
language:en
Short-container-title:Anal. Sci.

Author:

ZEMEK J.¹

Affiliation:

1. Institute of Physics, Academy of Sciences of the Czech Republic

Publisher

Springer Science and Business Media LLC

Subject

Analytical Chemistry

Link

http://www.jstage.jst.go.jp/article/analsci/26/2/26_2_177/_pdf

Reference60 articles.

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2. Surface analysis and angular distributions in x-ray photoelectron spectroscopy

3. 3. D. Briggs and J. T. Grant (ed.), “Surface Analysis by Auger and X-ray Photoelectron Spectroscopy”, 2003, IM Publications and Surface Spectra Ltd.

4. Evaluation of Calculated and Measured Electron Inelastic Mean Free Paths Near Solid Surfaces

5. Angle-resolved XPS and AES: Depth-resolution limits and a general comparison of properties of depth-profile reconstruction methods

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