Angle-resolved XPS depth-profiling strategies
Author:
Publisher
Elsevier BV
Subject
Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry
Reference6 articles.
1. Surface analysis and angular distributions in x-ray photoelectron spectroscopy
2. Angle-resolved XPS and AES: Depth-resolution limits and a general comparison of properties of depth-profile reconstruction methods
3. M.P. Seah, Practical Surface Analysis, in: D. Briggs, M.P. Seah (Eds.), 2nd edn., Wiley, Chichester, 1990, pp. 201–255.
4. Regularization: A stable and accurate method for generating depth profiles from angle-dependent XPS data
5. P.J. Cumpson, to be published.
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